Scopes
(The following topics include but are not limited to)
Topic 1: Instrument Science
Instrument Design Theory
Scientific instrument development
Intelligent Instrument Technology
Instrument calibration and standards
Instrument reliability
Embedded Instrument System
Virtual Instrument Technology
Instrument Science and Applications
Topic 2: Precision Measurement
Geometric precision measurement
Optical measurement technology
Coordinate measurement technology
Surface morphology measurement
Micro nano measurement methods
Dynamic measurement technology
Online measurement system
Measurement uncertainty
Topic 3: Automated Detection
Machine vision inspection
Automatic optical inspection
Automated Ultrasonic Testing
Electromagnetic non-destructive testing
Automated testing system
Detection signal processing
Testing quality control
Intelligent detection equipment
Important Dates/重要日期
  • Submission Deadline: 2026.5.17
  • Registration Deadline: 2026.5.27
  • Conference Date: 2026.6.1
  • Notification Date: About a week after the submission
Submission Portal/投稿方式

Mail Address:  eiic_Conference@163.com

If you have any question or need any assistance regarding the conference, please feel free to contact our conference specialists:

墨老师
  • +86-15680957221(微信同号)
  • 2580953988
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