Scopes
(Include but not limited to)
Track 1: Precise Measurement and Metrology Technology
Geometric precision measurement and ultra-precision measurement technology
Optical interferometry measurement and laser measurement technology
Nanometer measurement and micro-nano scale measurement
Coordinate measurement technology and three-dimensional measurement
Surface topography and roughness measurement
Precise displacement, angle and vibration measurement
Measurement uncertainty evaluation and value traceability
Online measurement and in-machine measurement technology
Large-size space measurement and industrial photogrammetry
Quantum metrology and new metrology standards
Error compensation and calibration in precise measurement
Multi-sensor fusion measurement system
Precise measurement technology in extreme environments
Online measurement methods in micro-nano manufacturing
Digital twin-driven measurement system simulation
Track 2: Instruments, Sensors and Intelligent Sensing
Precise instrument design and system integration
Intelligent sensors and sensor networks
Virtual instruments and software-defined instruments
Optical instruments and optical measurement instruments
Electronic measurement instruments and signal analyzers
Biomedical instruments and detection equipment
Environmental monitoring instruments and sensors
Industrial process detection instruments and control devices
Inertial devices and navigation instruments
Quantum sensors and quantum precise measurement
Flexible/wearable sensors and electronic skin
Micro-nano sensors and MEMS/NEMS devices
Sensor signal conditioning, calibration and calibration
Instrument reliability and environmental adaptability
Instrumentation intelligence and edge computing
Track 3: Electronic Testing and Automatic Test System
Analog/mixed-signal circuit testing technology
RF and microwave measurement technology
Integrated circuit testing and testability design (DFT)
System-on-Chip (SoC) testing and verification
Automatic test equipment (ATE) and test system design
Boundary scan and built-in self-test (BIST) technology
Signal integrity analysis and time-domain testing
High-speed digital circuit testing and eye diagram analysis
Electromagnetic compatibility testing and electromagnetic interference diagnosis
Power electronic device testing and reliability assessment
Optical and optical communication device testing technology
Sensor and MEMS device testing
Battery and energy storage system testing technology
Intelligent diagnosis, fault prediction and health management
Test data management and intelligent test optimization
......
Track 1: Precise Measurement and Metrology Technology
Geometric precision measurement and ultra-precision measurement technology
Optical interferometry measurement and laser measurement technology
Nanometer measurement and micro-nano scale measurement
Coordinate measurement technology and three-dimensional measurement
Surface topography and roughness measurement
Precise displacement, angle and vibration measurement
Measurement uncertainty evaluation and value traceability
Online measurement and in-machine measurement technology
Large-size space measurement and industrial photogrammetry
Quantum metrology and new metrology standards
Error compensation and calibration in precise measurement
Multi-sensor fusion measurement system
Precise measurement technology in extreme environments
Online measurement methods in micro-nano manufacturing
Digital twin-driven measurement system simulation
Track 2: Instruments, Sensors and Intelligent Sensing
Precise instrument design and system integration
Intelligent sensors and sensor networks
Virtual instruments and software-defined instruments
Optical instruments and optical measurement instruments
Electronic measurement instruments and signal analyzers
Biomedical instruments and detection equipment
Environmental monitoring instruments and sensors
Industrial process detection instruments and control devices
Inertial devices and navigation instruments
Quantum sensors and quantum precise measurement
Flexible/wearable sensors and electronic skin
Micro-nano sensors and MEMS/NEMS devices
Sensor signal conditioning, calibration and calibration
Instrument reliability and environmental adaptability
Instrumentation intelligence and edge computing
Track 3: Electronic Testing and Automatic Test System
Analog/mixed-signal circuit testing technology
RF and microwave measurement technology
Integrated circuit testing and testability design (DFT)
System-on-Chip (SoC) testing and verification
Automatic test equipment (ATE) and test system design
Boundary scan and built-in self-test (BIST) technology
Signal integrity analysis and time-domain testing
High-speed digital circuit testing and eye diagram analysis
Electromagnetic compatibility testing and electromagnetic interference diagnosis
Power electronic device testing and reliability assessment
Optical and optical communication device testing technology
Sensor and MEMS device testing
Battery and energy storage system testing technology
Intelligent diagnosis, fault prediction and health management
Test data management and intelligent test optimization
......
Important Dates/重要日期
- Submission Deadline: 2026.10.17
- Registration Deadline: 2026.10.24
- Conference Date: 2026.11.1
- Notification Date: About a week after the submission
Submission Portal/投稿方式
Mail Address: eicenfs_info@163.com
If you have any question or need any assistance regarding the conference, please feel free to contact our conference specialists:
徐老师
+86-15680829715(微信同号)
1347638002
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